Atom Probe Tomography Investigation of the Impact of Stacking Faults on InGaN/GaN Quantum Well LED Systems

Shu R, Oliver RA, Frentrup M, Kappers MJ, Xiu H, Kusch G, Wallis DJ, Hofer C, Bagot PAJ, Moody MP
24 July 2024
Journal article
Journal:
Microscopy and Microanalysis
Volume:
30
Issue:
2024
,
pp.
52 - 53
No abstract available
DOI
10.1093/mam/ozae044.024