Automated calibration of model-driven reconstructions in atom probe tomography

Fletcher C, Moody MP, Fleischmann C, Dialameh M, Porret C, Geiser B, Haley D

15 September 2022

Journal article

Journal:

JOURNAL OF PHYSICS D-APPLIED PHYSICS

Volume:

Issue:

No abstract available

Keywords:

atom probe tomography

correlative microscopy

data reconstruction

field evaporation

level set method

optimisation

semiconductor imaging

DOI

ORA record