David Tweddle
DPhil Student
Atom Probe Characterisation of Individual Dislocations in Multi-Crystalline Silicon
Multicrystalline silicon is the dominant industrial technology for photovoltaic solar cells. The efficiency of these solar cells is strongly limited by the presence of recombination active, decorated crystallographic defects. Two key treatments are used to reduce the impact of such defects, gettering and hydrogen passivation. My project intends to evaluate these efficiency-limiting defects, at the various stages of solar cell processing, using a multi-technique approach of electron beam induced current, transmission electron microscopy and atom probe tomography.
For more information Click Here to see my guest lecture at the University of New South Wales, Sydney.
